Quantum electronic stability of atomically uniform films

Citation:
Luh, DA, Miller T, Paggel JJ, Chou MY, Chiang TC.  2001.  Quantum electronic stability of atomically uniform films, May. Science. 292:1131-1133., Number 5519

Abstract:

We have studied the structural stability of thin silver films with thicknesses of N = 1 to 15 monolayers, deposited on an Fe(100) substrate. Photoemission spectroscopy results show that films of N = 1, 2, and 5 monolayer thicknesses are structurally stable for temperatures above 800 kelvin, whereas films of other thicknesses are unstable and bifurcate into a film with N +/- 1 monolayer thicknesses at temperatures around 400 kelvin, The results are in agreement with theoretical predictions that consider the electronic energy of the quantum well associated with a particular film thickness as a significant contribution-to the film stability.

Notes:

ISI Document Delivery No.: 431AFTimes Cited: 111Cited Reference Count: 14Cited References: Kondo Y, 2000, SCIENCE, V289, P606, DOI 10.1126/science.289.5479.606 Tosatti E, 2000, SCIENCE, V289, P561, DOI 10.1126/science.289.5479.561 Paggel JJ, 2000, PHYS REV B, V61, P1804, DOI 10.1103/PhysRevB.61.1804 Chiang TC, 2000, SURF SCI REP, V39, P181, DOI 10.1016/S0167-5729(00)00006-6 Yanson AI, 1999, NATURE, V400, P144 Paggel JJ, 1999, SCIENCE, V283, P1709, DOI 10.1126/science.283.5408.1709 ROCO MC, 1999, NANOTECHNOLOGY RES D Paggel JJ, 1998, PHYS REV LETT, V81, P5632, DOI 10.1103/PhysRevLett.81.5632 Zhang ZY, 1998, PHYS REV LETT, V80, P5381, DOI 10.1103/PhysRevLett.80.5381 EVANS DA, 1997, SURF SCI, V376, P1 Smith AR, 1996, SCIENCE, V273, P226, DOI 10.1126/science.273.5272.226 KNIGHT WD, 1984, PHYS REV LETT, V52, P2141, DOI 10.1103/PhysRevLett.52.2141 KUMIKOV VK, 1983, J APPL PHYS, V54, P1346, DOI 10.1063/1.332209 SMITH NV, 1974, PHYS REV B, V9, P1341, DOI 10.1103/PhysRevB.9.1341Luh, DA Miller, T Paggel, JJ Chou, MY Chiang, TCAMER ASSOC ADVANCEMENT SCIENCEWASHINGTON

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