Electrical, thermal and structural properties of microcrystalline Si thin films | Kuei-Hsien Chen

Electrical, thermal and structural properties of microcrystalline Si thin films

Citation:: Das*, D, Jana M, Barua AK, Chattopadhyay S, Chen LC, Chen KH. 2002. Electrical, thermal and structural properties of microcrystalline Si thin films. Jpn.Appl. Phys. Lett.. 41:L229-232.