Miskovsky, NM, Wei CM, Tsong TT.
1992.
FIELD EVAPORATION OF SILICON IN THE FIELD-ION MICROSCOPE AND SCANNING TUNNELING MICROSCOPE CONFIGURATIONS, Oct. Physical Review Letters. 69:2427-2430., Number 16
AbstractField evaporation of silicon as positive and negative ions in the field ion microscope and scanning tunneling microscope configurations is investigated with the charge-exchange model using atomic potentials from an empirical potential due to Tersoff [Phys. Rev. B 37, 6991 (1988)] and an environment dependent potential developed by Bolding and Andersen [Phys. Rev. B 41, 10568 (1990)]. For the geometry of the field ion microscope, Si+ should be the observable ion species. In the close-spaced electrode geometry of the scanning tunneling microscope, Si2- should be the favored ion species since it requires the lowest evaporation field.
Wei, SQ, Chou MY.
1992.
ABINITIO CALCULATION OF FORCE-CONSTANTS AND FULL PHONON DISPERSIONS, Nov. Physical Review Letters. 69:2799-2802., Number 19
AbstractWe present a method to calculate the full phonon spectrum using the local-density approximation and Hellmann-Feynman forces. By a limited number of supercell calculations of the planar force constants, the interatomic force constant matrices are determined. One can then construct the dynamical matrix for any arbitrary wave vector in the Brillouin zone. We describe in detail the procedure for elements in the diamond structure and derive the phonon dispersion curves for Si. The anharmonic effects can also be studied by the present method.
Tong, SY, Huang H, Wei CM.
1992.
METHOD FOR SPATIALLY RESOLVED IMAGING OF ENERGY-DEPENDENT PHOTOELECTRON DIFFRACTION, Jul. Physical Review B. 46:2452-2459., Number 4
AbstractWe present a method for spatially resolved imaging of energy-dependent photoelectron diffraction. Energy-dependent photoelectron-diffraction spectra are individually Fourier transformed to three-dimensional vector space. The complex transformed amplitudes are summed over a span of phi angles or over a span of polar angles. The images are, respectively, well resolved in the radial and azimuthal directions, or in the radial and polar directions. The intersections of these real-space maps fix the atomic coordinates. We show how the intensity loci from single and multiple scattering paths are separately resolved and how most multiple scattering contributions are eliminated. By varying the collection angles, atoms in different regions relative to the emitter, e.g., surface or bulk atoms, are imaged. One can also use the photon's A vector to enhance the near-pi backscattering geometry. We compare this method with another direct method: extended x-ray-absorption fine structure.
Wei, CM, Tong SY.
1992.
DIRECT ATOMIC-STRUCTURE BY HOLOGRAPHIC DIFFUSE LEED, Aug. Surface Science. 274:L577-L582., Number 3
AbstractA multiple-energy phase-summing method is applied to diffuse low-energy electron diffraction intensity spectra to obtain three-dimensional images of surface atoms. In this demonstration, calculated DLEED intensity spectra from a multiple scattering method are directly inverted to produce high-fidelity 3D images of near-neighbor atoms measured from an adatom. No prior knowledge of adsorption site, bond length, bond angle, or type of atom is needed. The images are essentially free from artifacts and have a spatial resolution of approximately 1 angstrom when viewed along any cut-plane. These results demonstrate that holographic DLEED has the potential of being an accurate and direct structural tool for low-density disordered adsorption systems.
Kao, HC, Kuo TY, Yen HP, Wei CM, Huang KN.
1992.
RELATIVISTIC CROSS-SECTIONS OF ELECTRON-IMPACT IONIZATION OF HYDROGENIC IONS, Apr. Physical Review A. 45:4646-4652., Number 7
AbstractTotal and single-differential cross sections for electron-impact ionization are calculated in a relativistic formulation for ions in the hydrogen isoelectronic sequence: HI, He II, C VI, Ne X, Fe XXVI, and Ag XLVII. Transition amplitudes are evaluated in the two-potential distorted-wave approximation. Sets of different asymptotic charges are used to study the mutual screening of the primary and secondary electrons. Relativistic effects are investigated by taking the nonrelativistic limit and are found to increase the cross sections. Thomson’s scaling law along the isoelectronic sequence is also studied.