DIRECT ATOMIC IMAGING USING EXPERIMENTAL MULTIPLE-ENERGY KIKUCHI ELECTRON PATTERNS
- Citation:
- Wei, C. M., Hong I. H., Jeng P. R., Shyu S. C., & Chou Y. C. (1994). DIRECT ATOMIC IMAGING USING EXPERIMENTAL MULTIPLE-ENERGY KIKUCHI ELECTRON PATTERNS. Physical Review B. 49, 5109-5112., Feb, Number 7
Abstract:
We demonstrate a direct surface structural tool with high resolution of approximately 1 angstrom in all directions by direct Fourier transformation of measured Kikuchi patterns using a multiple-energy phase-summing method. In this method, with an integral over continuous energy spectra in each direction, both the forward- and backward-scattering oscillations are selected for Fourier transformation by varying the energy range and size of the grid. High-fidelity and artifact-free three-dimensional images of Ag atoms for (100) and (111) single-crystal surfaces are obtained.
Notes:
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