@article {492,
	title = {DIRECT ATOMIC IMAGING USING EXPERIMENTAL MULTIPLE-ENERGY KIKUCHI ELECTRON PATTERNS},
	journal = {Physical Review B},
	volume = {49},
	number = {7},
	year = {1994},
	note = {<p>ISI Document Delivery No.: MZ448Times Cited: 12Cited Reference Count: 11Cited References: BARTON JJ, 1988, PHYS REV LETT, V61, P1356, DOI 10.1103/PhysRevLett.61.1356 BARTON JJ, 1991, PHYS REV LETT, V67, P3106, DOI 10.1103/PhysRevLett.67.3106 HARP GR, 1990, PHYS REV LETT, V65, P1012, DOI 10.1103/PhysRevLett.65.1012 POON HC, 1986, PHYS REV B, V33, P2198, DOI 10.1103/PhysRevB.33.2198 SALDIN DK, 1990, PHYS REV LETT, V64, P1270, DOI 10.1103/PhysRevLett.64.1270 TERMINELLO LJ, 1993, PHYS REV LETT, V70, P599, DOI 10.1103/PhysRevLett.70.599 TONG SY, 1992, PHYS REV B, V46, P2452, DOI 10.1103/PhysRevB.46.2452 TONG SY, 1991, PHYS REV LETT, V66, P60, DOI 10.1103/PhysRevLett.66.60 TONG SY, 1991, PHYS REV LETT, V67, P3102, DOI 10.1103/PhysRevLett.67.3102 TONNER BP, 1991, PHYS REV B, V43, P14423, DOI 10.1103/PhysRevB.43.14423 WEI CM, 1992, SURF SCI, V274, pL577, DOI 10.1016/0039-6028(92)90828-TWEI, CM HONG, IH JENG, PR SHYU, SC CHOU, YCAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Feb},
	pages = {5109-5112},
	type = {Note},
	abstract = {<p>We demonstrate a direct surface structural tool with high resolution of approximately 1 angstrom in all directions by direct Fourier transformation of measured Kikuchi patterns using a multiple-energy phase-summing method. In this method, with an integral over continuous energy spectra in each direction, both the forward- and backward-scattering oscillations are selected for Fourier transformation by varying the energy range and size of the grid. High-fidelity and artifact-free three-dimensional images of Ag atoms for (100) and (111) single-crystal surfaces are obtained.</p>
},
	keywords = {DIFFRACTION, FORWARD-SCATTERING, HOLOGRAPHY, LEED, SPECTROSCOPIES},
	isbn = {0163-1829},
	url = {<Go to ISI>://WOS:A1994MZ44800102},
	author = {Wei, C. M. and Hong, I. H. and Jeng, P. R. and Shyu, S. C. and Chou, Y. C.}
}
