<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Wei, C. M.</style></author><author><style face="normal" font="default" size="100%">Hong, I. H.</style></author><author><style face="normal" font="default" size="100%">Jeng, P. R.</style></author><author><style face="normal" font="default" size="100%">Shyu, S. C.</style></author><author><style face="normal" font="default" size="100%">Chou, Y. C.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">DIRECT ATOMIC IMAGING USING EXPERIMENTAL MULTIPLE-ENERGY KIKUCHI ELECTRON PATTERNS</style></title><secondary-title><style face="normal" font="default" size="100%">Physical Review B</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">DIFFRACTION</style></keyword><keyword><style  face="normal" font="default" size="100%">FORWARD-SCATTERING</style></keyword><keyword><style  face="normal" font="default" size="100%">HOLOGRAPHY</style></keyword><keyword><style  face="normal" font="default" size="100%">LEED</style></keyword><keyword><style  face="normal" font="default" size="100%">SPECTROSCOPIES</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">1994</style></year><pub-dates><date><style  face="normal" font="default" size="100%">Feb</style></date></pub-dates></dates><urls><web-urls><url><style face="normal" font="default" size="100%">&lt;Go to ISI&gt;://WOS:A1994MZ44800102</style></url></web-urls></urls><number><style face="normal" font="default" size="100%">7</style></number><volume><style face="normal" font="default" size="100%">49</style></volume><pages><style face="normal" font="default" size="100%">5109-5112</style></pages><isbn><style face="normal" font="default" size="100%">0163-1829</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;We demonstrate a direct surface structural tool with high resolution of approximately 1 angstrom in all directions by direct Fourier transformation of measured Kikuchi patterns using a multiple-energy phase-summing method. In this method, with an integral over continuous energy spectra in each direction, both the forward- and backward-scattering oscillations are selected for Fourier transformation by varying the energy range and size of the grid. High-fidelity and artifact-free three-dimensional images of Ag atoms for (100) and (111) single-crystal surfaces are obtained.&lt;/p&gt;
</style></abstract><work-type><style face="normal" font="default" size="100%">Note</style></work-type><notes><style face="normal" font="default" size="100%">&lt;p&gt;ISI Document Delivery No.: MZ448Times Cited: 12Cited Reference Count: 11Cited References: BARTON JJ, 1988, PHYS REV LETT, V61, P1356, DOI 10.1103/PhysRevLett.61.1356 BARTON JJ, 1991, PHYS REV LETT, V67, P3106, DOI 10.1103/PhysRevLett.67.3106 HARP GR, 1990, PHYS REV LETT, V65, P1012, DOI 10.1103/PhysRevLett.65.1012 POON HC, 1986, PHYS REV B, V33, P2198, DOI 10.1103/PhysRevB.33.2198 SALDIN DK, 1990, PHYS REV LETT, V64, P1270, DOI 10.1103/PhysRevLett.64.1270 TERMINELLO LJ, 1993, PHYS REV LETT, V70, P599, DOI 10.1103/PhysRevLett.70.599 TONG SY, 1992, PHYS REV B, V46, P2452, DOI 10.1103/PhysRevB.46.2452 TONG SY, 1991, PHYS REV LETT, V66, P60, DOI 10.1103/PhysRevLett.66.60 TONG SY, 1991, PHYS REV LETT, V67, P3102, DOI 10.1103/PhysRevLett.67.3102 TONNER BP, 1991, PHYS REV B, V43, P14423, DOI 10.1103/PhysRevB.43.14423 WEI CM, 1992, SURF SCI, V274, pL577, DOI 10.1016/0039-6028(92)90828-TWEI, CM HONG, IH JENG, PR SHYU, SC CHOU, YCAMERICAN PHYSICAL SOCCOLLEGE PK&lt;/p&gt;
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