QUANTITATIVE STRUCTURAL DETERMINATION OF METALLIC FILM GROWTH ON A SEMICONDUCTOR CRYSTAL - (SQUARE-ROOT-3)R30-DEGREES- (1X1) PB ON GE(111) - REPLY
- Citation:
- Huang, H., Wei C. M., Tonner B. P., & Tong S. Y. (1990). QUANTITATIVE STRUCTURAL DETERMINATION OF METALLIC FILM GROWTH ON A SEMICONDUCTOR CRYSTAL - (SQUARE-ROOT-3)R30-DEGREES- (1X1) PB ON GE(111) - REPLY. Physical Review Letters. 64, 1183-1183., Mar, Number 10
Abstract:
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Notes:
ISI Document Delivery No.: CQ970Times Cited: 0Cited Reference Count: 4Cited References: DEV BN, 1990, PHYS REV LETT, V64, P1182, DOI 10.1103/PhysRevLett.64.1182 DEV BN, 1988, EUROPHYS LETT, V6, P311, DOI 10.1209/0295-5075/6/4/006 FEIDENHANSL R, 1986, SURF SCI, V178, P927, DOI 10.1016/0039-6028(86)90369-9 HUANG H, 1989, PHYS REV LETT, V62, P559, DOI 10.1103/PhysRevLett.62.559HUANG, H WEI, CM TONNER, BP TONG, SYAMERICAN PHYSICAL SOCCOLLEGE PK
