@article {478,
	title = {QUANTITATIVE STRUCTURAL DETERMINATION OF METALLIC FILM GROWTH ON A SEMICONDUCTOR CRYSTAL - (SQUARE-ROOT-3)R30-DEGREES- (1X1) PB ON GE(111) - REPLY},
	journal = {Physical Review Letters},
	volume = {64},
	number = {10},
	year = {1990},
	note = {<p>ISI Document Delivery No.: CQ970Times Cited: 0Cited Reference Count: 4Cited References: DEV BN, 1990, PHYS REV LETT, V64, P1182, DOI 10.1103/PhysRevLett.64.1182 DEV BN, 1988, EUROPHYS LETT, V6, P311, DOI 10.1209/0295-5075/6/4/006 FEIDENHANSL R, 1986, SURF SCI, V178, P927, DOI 10.1016/0039-6028(86)90369-9 HUANG H, 1989, PHYS REV LETT, V62, P559, DOI 10.1103/PhysRevLett.62.559HUANG, H WEI, CM TONNER, BP TONG, SYAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Mar},
	pages = {1183-1183},
	type = {Letter},
	abstract = {<p>n/a</p>
},
	isbn = {0031-9007},
	url = {<Go to ISI>://WOS:A1990CQ97000033},
	author = {Huang, H. and Wei, C. M. and Tonner, B. P. and Tong, S. Y.}
}
