ELECTRON-EMISSION HOLOGRAPHY - A NEW DIRECT METHOD FAR SURFACE STRUCTURAL DETERMINATION
- Citation:
- Wei, C. M., Hong I. H., Jeng P. R., Shyu S. C., & Chou Y. C. (1994). ELECTRON-EMISSION HOLOGRAPHY - A NEW DIRECT METHOD FAR SURFACE STRUCTURAL DETERMINATION. Chemical Physics Letters. 228, 513-518., Oct, Number 6
Abstract:
Direct inversion of measured Kikuchi and simulated photoelectron diffraction patterns shows clear images of the neighboring atoms within the range of the electron mean free path. More than ten nearby atoms are obtained for the Ag(100), Si(100) and (2X1) Na/Si(100) systems by the integral-energy phase-summing method. The key point in removing artifacts is a correct role of background subtraction. When this is achieved, the three-dimensional images are essentially high fidelity and artifact free. This demonstrates that electron-emission holography can be used as a direct local structural probe.
Notes:
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