@article {491,
	title = {ELECTRON-EMISSION HOLOGRAPHY - A NEW DIRECT METHOD FAR SURFACE STRUCTURAL DETERMINATION},
	journal = {Chemical Physics Letters},
	volume = {228},
	number = {6},
	year = {1994},
	note = {<p>ISI Document Delivery No.: PL261Times Cited: 11Cited Reference Count: 31Cited References: BARTON JJ, 1988, PHYS REV LETT, V61, P1356, DOI 10.1103/PhysRevLett.61.1356 BARTON JJ, 1991, PHYS REV LETT, V67, P3106, DOI 10.1103/PhysRevLett.67.3106 BARTON JJ, 1991, STRUCTURE SURFACES, V3 CHAMBERS SA, 1992, J VAC SCI TECHNOL B, V10, P2092, DOI 10.1116/1.586324 DIPPEL R, 1992, PHYS REV LETT, V68, P1543, DOI 10.1103/PhysRevLett.68.1543 HARP GR, 1990, PHYS REV LETT, V65, P1012, DOI 10.1103/PhysRevLett.65.1012 HARP GR, 1990, PHYS REV B, V42, P9199, DOI 10.1103/PhysRevB.42.9199 HONG IH, 1994, SURF SCI, V312, pL743, DOI 10.1016/0039-6028(94)90794-3 HU P, 1992, PHYS REV B, V46, P13615, DOI 10.1103/PhysRevB.46.13615 HU P, 1992, NATURE, V360, P656 HUSSAIN Z, 1981, P NATL ACAD SCI USA, V78, P5293, DOI 10.1073/pnas.78.9.5293 LI H, 1993, PHYS REV B, V47, P10036, DOI 10.1103/PhysRevB.47.10036 MENDEZ MA, 1992, PHYS REV B, V45, P9402, DOI 10.1103/PhysRevB.45.9402 ORDERS PJ, 1983, PHYS REV B, V27, P781, DOI 10.1103/PhysRevB.27.781 POON HC, 1986, PHYS REV B, V33, P2198, DOI 10.1103/PhysRevB.33.2198 SALDIN DK, 1990, PHYS REV LETT, V64, P1270, DOI 10.1103/PhysRevLett.64.1270 SALDIN DK, 1993, PHYS REV LETT, V70, P1112, DOI 10.1103/PhysRevLett.70.1112 SZOKE A, 1986, AIP C P, V147 TERMINELLO LJ, 1993, PHYS REV LETT, V70, P599, DOI 10.1103/PhysRevLett.70.599 THEVUTHASAN S, 1993, PHYS REV LETT, V70, P595, DOI 10.1103/PhysRevLett.70.595 TOBIN JG, 1993, PHYS REV LETT, V70, P4150, DOI 10.1103/PhysRevLett.70.4150 TONG SY, 1992, PHYS REV B, V46, P2452, DOI 10.1103/PhysRevB.46.2452 TONG SY, 1991, PHYS REV LETT, V66, P60, DOI 10.1103/PhysRevLett.66.60 TONG SY, 1992, PHYS REV LETT, V69, P3654, DOI 10.1103/PhysRevLett.69.3654 TONG SY, 1991, PHYS REV LETT, V67, P3102, DOI 10.1103/PhysRevLett.67.3102 TONNER BP, 1991, PHYS REV B, V43, P14423, DOI 10.1103/PhysRevB.43.14423 WEI CM, 1992, SURF SCI, V274, pL577, DOI 10.1016/0039-6028(92)90828-T WEI CM, 1994, SURFACE REV LETT, V1 WEI CM, 1990, PHYS REV B, V42, P11284, DOI 10.1103/PhysRevB.42.11284 WEI CM, 1994, PHYS REV B, V49, P5109, DOI 10.1103/PhysRevB.49.5109 WU H, 1993, PHYS REV LETT, V71, P251, DOI 10.1103/PhysRevLett.71.251WEI, CM HONG, IH JENG, PR SHYU, SC CHOU, YCELSEVIER SCIENCE BVAMSTERDAM</p>
},
	month = {Oct},
	pages = {513-518},
	type = {Article},
	abstract = {<p>Direct inversion of measured Kikuchi and simulated photoelectron diffraction patterns shows clear images of the neighboring atoms within the range of the electron mean free path. More than ten nearby atoms are obtained for the Ag(100), Si(100) and (2X1) Na/Si(100) systems by the integral-energy phase-summing method. The key point in removing artifacts is a correct role of background subtraction. When this is achieved, the three-dimensional images are essentially high fidelity and artifact free. This demonstrates that electron-emission holography can be used as a direct local structural probe.</p>
},
	keywords = {AUGER, DIRECT ATOMIC-STRUCTURE, FORWARD-SCATTERING, IMAGES, LOW-ENERGY-ELECTRON, MULTIPLE-SCATTERING, PHOTOELECTRON DIFFRACTION, PHOTOEMISSION, RECONSTRUCTION, SPECTROSCOPIES},
	isbn = {0009-2614},
	url = {<Go to ISI>://WOS:A1994PL26100003},
	author = {Wei, C. M. and Hong, I. H. and Jeng, P. R. and Shyu, S. C. and Chou, Y. C.}
}
