Strong electric-field effects on the structure profiles of doubly excited resonances in He ground-state photoionization | Theoretical Atomic Collisions Laboratory

Strong electric-field effects on the structure profiles of doubly excited resonances in He ground-state photoionization

Citation:: Fang, TK, Ho YK. 1999. Strong electric-field effects on the structure profiles of doubly excited resonances in He ground-state photoionization. Physical Review A. 60:2145., Number 3: APS

Abstract:

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