@article {1413,
	title = {Thermal stability and electronic structure of atomically uniform Pb films on Si(111)},
	journal = {Physical Review Letters},
	volume = {93},
	number = {2},
	year = {2004},
	note = {<p>ISI Document Delivery No.: 836CFTimes Cited: 90Cited Reference Count: 21Cited References:      Wei CM, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.233408     Mans A, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.195410     Luh DA, 2002, PHYS REV LETT, V88, DOI 10.1103/PhysRevLett.88.256802     Hupalo M, 2002, PHYS REV B, V65, DOI 10.1103/PhysRevB.65.205406     Hupalo M, 2001, PHYS REV B, V64, DOI 10.1103/PhysRevB.64.155307     Schmidt T, 2001, SURF SCI, V480, P137, DOI 10.1016/S0039-6028(01)00828-7     Su WB, 2001, PHYS REV LETT, V86, P5116, DOI 10.1103/PhysRevLett.86.5116     Luh DA, 2001, SCIENCE, V292, P1131, DOI 10.1126/science.292.5519.1131     Chiang TC, 2000, SURF SCI REP, V39, P181, DOI 10.1016/S0167-5729(00)00006-6     Paggel JJ, 1999, SCIENCE, V283, P1709, DOI 10.1126/science.283.5408.1709     Schmitsdorf RF, 1999, EUR PHYS J B, V7, P457, DOI 10.1007/s100510050634     Altfeder IB, 1997, PHYS REV LETT, V78, P2815, DOI 10.1103/PhysRevLett.78.2815     JALOCHOWSKI M, 1995, PHYS REV B, V51, P7231, DOI 10.1103/PhysRevB.51.7231     HWANG IS, 1995, SURF SCI, V323, P241, DOI 10.1016/0039-6028(94)00613-X     JALOCHOWSKI M, 1992, PHYS REV B, V46, P4693, DOI 10.1103/PhysRevB.46.4693     CARLISLE JA, 1992, PHYS REV B, V45, P3400, DOI 10.1103/PhysRevB.45.3400     HESLINGA DR, 1990, PHYS REV LETT, V64, P1589, DOI 10.1103/PhysRevLett.64.1589     SMITH NV, 1985, PHYS REV B, V32, P3549, DOI 10.1103/PhysRevB.32.3549     ESTRUP PJ, 1964, SURF SCI, V2, P465, DOI 10.1016/0039-6028(64)90088-3     TRINGIDES MC, COMMUNICATION     WEI CM, UNPUBUpton, MH Wei, CM Chou, MY Miller, T Chiang, TCAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Jul},
	pages = {4},
	type = {Article},
	abstract = {<p>Atomically uniform Pb films are successfully prepared on Si(111), despite a large lattice mismatch. Angle-resolved photoemission measurements of the electronic structure show layer-resolved quantum well states which can be correlated with dramatic variations in thermal stability. The odd film thicknesses N=5, 7, and 9 monolayers show sharp quantum well states. The even film thicknesses N=6 and 8 do not, but are much more stable than the odd film thicknesses. This correlation is discussed in terms of a total energy calculation and Friedel-like oscillations in properties.</p>
},
	keywords = {GROWTH, PHOTOEMISSION, SCHOTTKY-BARRIER, STATES, SURFACES},
	isbn = {0031-9007},
	url = {<Go to ISI>://WOS:000222532100057},
	author = {Upton, M. H. and Wei, C. M. and Chou, M. Y. and Miller, T. and Chiang, T. C.}
}
