@article {1400,
	title = {X-ray studies of phonon softening in TiSe2},
	journal = {Physical Review Letters},
	volume = {86},
	number = {17},
	year = {2001},
	note = {<p>ISI Document Delivery No.: 426FCTimes Cited: 37Cited Reference Count: 20Cited References:      Pillo T, 2000, PHYS REV B, V61, P16213, DOI 10.1103/PhysRevB.61.16213     Chou MY, 2000, PHYS REV LETT, V84, P3733, DOI 10.1103/PhysRevLett.84.3733     Holt M, 2000, PHYS REV LETT, V84, P3734, DOI 10.1103/PhysRevLett.84.3734     MINOR W, 1989, PHYS REV B, V39, P1360, DOI 10.1103/PhysRevB.39.1360     WANG YR, 1989, PHYS REV B, V39, P1357, DOI 10.1103/PhysRevB.39.1357     GORKOV L, 1989, CHARGE DENSITY WAVES     MOTIZUKI K, 1986, STRUCTURAL PHASE TRA     ENZ CP, 1979, DYNAMIC CRITICAL PHE     JASWAL SS, 1979, PHYS REV B, V20, P5297, DOI 10.1103/PhysRevB.20.5297     MONCTON DE, 1978, P INT C LATT DYN, P561     WAKABAYASHI N, 1978, SOLID STATE COMMUN, V28, P923, DOI 10.1016/0038-1098(78)90112-6     WILSON JA, 1978, PHYS STATUS SOLIDI B, V86, P11, DOI 10.1002/pssb.2220860102     HUGHES HP, 1977, J PHYS C SOLID STATE, V10, pL319, DOI 10.1088/0022-3719/10/11/009     WHITE RM, 1977, NUOVO CIMENTO B, V38, P280, DOI 10.1007/BF02723497     DISALVO FJ, 1976, PHYS REV B, V14, P4321, DOI 10.1103/PhysRevB.14.4321     STIRLING WG, 1976, SOLID STATE COMMUN, V18, P931, DOI 10.1016/0038-1098(76)90240-4     WOO KC, 1976, PHYS REV B, V14, P3242, DOI 10.1103/PhysRevB.14.3242     BHATT RN, 1975, PHYS REV B, V12, P2042, DOI 10.1103/PhysRevB.12.2042     WILSON JA, 1969, ADV PHYS, V18, P193, DOI 10.1080/00018736900101307     KOHN W, 1967, PHYS REV LETT, V19, P439, DOI 10.1103/PhysRevLett.19.439Holt, M Zschack, P Hong, H Chou, MY Chiang, TCAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Apr},
	pages = {3799-3802},
	type = {Article},
	abstract = {<p>The charge-density-wave transition in TiSe2, which results in a commensurate (2 X 2 X 2) superlattice at temperatures below similar to 200 K, presumably involves softening of a zone-boundary phonon mode. For the first time, this phonon-softening behavior has been examined over a wide temperature range by synchroton x-ray thermal diffuse scattering.</p>
},
	keywords = {DISPERSIONS, EXAMPLE, Silicon, TRANSMISSION SCATTERING},
	isbn = {0031-9007},
	url = {<Go to ISI>://WOS:000168338300026},
	author = {Holt, M. and Zschack, P. and Hong, H. and Chou, M. Y. and Chiang, T. C.}
}
