Surface vs. bulk electronic structure of silver determined by photoemission
- Citation:
- Speer, N. J., Brinkley M. K., Liu Y., Wei C. M., Miller T., & Chiang T. C. (2009). Surface vs. bulk electronic structure of silver determined by photoemission. Epl. 88, 5., Dec, Number 6
Abstract:
Whether photoemission probes surface or bulk properties has long been a topic of interest and debate. This work employs angle-resolved photoemission to map the electronic structure of Ag films of varying thicknesses prepared on Si(111). As expected, the discrete quantum-well states or subbands observed at small thicknesses merge into a continuum as the film thickness approaches the bulk limit. However, a number of discrete states remain isolated within gaps or pockets in the bulk continuum. While these Ag surface states have been predicted previously by calculations, most are experimentally identified herein only for the first time. Copyright (C) EPLA, 2009
Notes:
ISI Document Delivery No.: 546ZKTimes Cited: 4Cited Reference Count: 24Cited References: Aballe L, 2002, PHYS REV B, V65, DOI 10.1103/PhysRevB.65.125319 CAMPUZANO JC, 2004, PHYS SUPERCONDUCTORS Chiang TC, 2000, SURF SCI REP, V39, P181, DOI 10.1016/S0167-5729(00)00006-6 COURTHS R, 1987, SOLID STATE COMMUN, V61, P257, DOI 10.1016/0038-1098(87)91014-3 Damascelli A, 2003, REV MOD PHYS, V75, P473, DOI 10.1103/RevModPhys.75.473 HEIMANN P, 1979, PHYS REV B, V20, P3059, DOI 10.1103/PhysRevB.20.3059 Himpsel FJ, 1998, ADV PHYS, V47, P511, DOI 10.1080/000187398243519 HO KM, 1983, J ELECTROANAL CHEM, V150, P235, DOI 10.1016/S0022-0728(83)80206-X Hufner S., 2003, PHOTOELECTRON SPECTR Kawakami RK, 1999, NATURE, V398, P132 KEVAN SD, 1987, PHYS REV B, V36, P5809, DOI 10.1103/PhysRevB.36.5809 Kresse G, 1996, PHYS REV B, V54, P11169, DOI 10.1103/PhysRevB.54.11169 KRESSE G, 1994, J PHYS-CONDENS MAT, V6, P8245, DOI 10.1088/0953-8984/6/40/015 LINDGREN SA, 2000, HDB SURFACE SCI ELEC, V2 Luh DA, 2000, PHYS REV LETT, V84, P3410, DOI 10.1103/PhysRevLett.84.3410 Marini A, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.115101 Miller T, 1996, PHYS REV LETT, V77, P1167, DOI 10.1103/PhysRevLett.77.1167 Milun M, 2002, REP PROG PHYS, V65, P99, DOI 10.1088/0034-4885/65/2/201 Paggel JJ, 1999, SCIENCE, V283, P1709, DOI 10.1126/science.283.5408.1709 SMITH NV, 1974, PHYS REV B, V9, P1365, DOI 10.1103/PhysRevB.9.1365 SMITH NV, 1974, PHYS REV B, V9, P1341, DOI 10.1103/PhysRevB.9.1341 Somorjai GA, 1981, CHEM 2 DIMENSIONS SU Speer NJ, 2006, SCIENCE, V314, P804, DOI 10.1126/science.1132941 Tang SJ, 2004, PHYS REV LETT, V93, DOI 10.1103/PhysRevLett.93.216804Speer, N. J. Brinkley, M. K. Liu, Y. Wei, C. M. Miller, T. Chiang, T. -C.U. S. Department of Energy [DE-FG02-07ER46383]; American Chemical Society; U.S. National Science Foundation [DMR-05-03323, DMR-09-06444, DMR-05-37588]This project is supported by the U. S. Department of Energy (grant DE-FG02-07ER46383). We acknowledge the Petroleum Research Fund, administered by the American Chemical Society, and the U.S. National Science Foundation (grants DMR-05-03323 and DMR-09-06444) for partial support of personnel and the beamline facilities at the Synchrotron Radiation Center. The Synchrotron Radiation Center is supported by the U. S. National Science Foundation (grant DMR-05-37588).EPL ASSOCIATION, EUROPEAN PHYSICAL SOCIETYMULHOUSE
