QUANTITATIVE STRUCTURAL DETERMINATION OF METALLIC FILM GROWTH ON A SEMICONDUCTOR CRYSTAL - (SQUARE-ROOT-3 X SQUARE-ROOT-3)R30-DEGREES- (1X1) PB ON GE(111)
- Citation:
- Huang, H., Wei C. M., Li H., Tonner B. P., & Tong S. Y. (1989). QUANTITATIVE STRUCTURAL DETERMINATION OF METALLIC FILM GROWTH ON A SEMICONDUCTOR CRYSTAL - (SQUARE-ROOT-3 X SQUARE-ROOT-3)R30-DEGREES- (1X1) PB ON GE(111). Physical Review Letters. 62, 559-562., Jan, Number 5
Abstract:
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Notes:
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