Holography with Kikuchi electrons: Direct imaging of ordered trimers on Au/Si(111)(root 3x root 3)R30 degrees and Sb/Si(111)(root 3x root 3)R30 degrees interfaces

Citation:
Hong, I. H., Jih M. C., Chou Y. C., & Wei C. M. (1997).  Holography with Kikuchi electrons: Direct imaging of ordered trimers on Au/Si(111)(root 3x root 3)R30 degrees and Sb/Si(111)(root 3x root 3)R30 degrees interfaces. Surface Review and Letters. 4, 733-756., Aug, Number 4

Abstract:

The structural bases on the metal/semiconductor interfaces, such as gold trimers on the Au/Si (111)(root 3 x root 3)R30 degrees surface and antimony trimers on the Sb/Si(111)(root 3 x root 3)R30 degrees surface, can be imaged directly with a simple inversion of low-energy (<600 eV) Kikuchi-electron patterns (Kikuchi-electron holography-KEH). The relative positions of the building blocks (trimers) on the adsorbates to the substrate atoms are also determined. This short-range-order KEH tool, which provides the 3D Patterson function, can be viewed as a twin of grazing-incidence X-ray diffraction. Using direct structural information obtained by KEH, one can greatly reduce the tested models in a complete trial-and-error structural-determination process.

Notes:

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