@article {481,
	title = {PHASE-SHIFT CORRECTION IN 3-DIMENSIONAL IMAGING USING FORWARD-SCATTERING PHOTOEMISSION AND AUGER SPECTROSCOPIES},
	journal = {Physical Review Letters},
	volume = {66},
	number = {1},
	year = {1991},
	note = {<p>ISI Document Delivery No.: ER074Times Cited: 105Cited Reference Count: 21Cited References:      BARTON JJ, 1988, PHYS REV LETT, V61, P1345     BEDROSSIAN P, 1989, PHYS REV LETT, V63, P2357     CHAMBERS SA, 1985, PHYS REV B, V32, P4872, DOI 10.1103/PhysRevB.32.4872     EGELHOFF WF, 1990, CRIT REV SOLID STATE, V16, P213, DOI 10.1080/10408439008244629     FADLEY CS, 1989, SYNCHROTRON RAD RES     HARP GR, 1990, PHYS REV LETT, V65, P1012, DOI 10.1103/PhysRevLett.65.1012     HEADRICK RL, 1989, PHYS REV LETT, V63, P1253, DOI 10.1103/PhysRevLett.63.1253     HUANG H, 1990, PHYS REV B, V41, P3276, DOI 10.1103/PhysRevB.41.3276     KAXIRAS E, 1990, PHYS REV B, V41, P1262, DOI 10.1103/PhysRevB.41.1262     LI CH, 1978, PHYS REV B, V17, P3128, DOI 10.1103/PhysRevB.17.3128     LI H, 1988, PHYS REV B, V37, P3959, DOI 10.1103/PhysRevB.37.3959     LI H, IN PRESS PHYS REV B     LYO IW, 1989, PHYS REV LETT, V63, P1261, DOI 10.1103/PhysRevLett.63.1261     POON HC, 1986, PHYS REV B, V33, P2198, DOI 10.1103/PhysRevB.33.2198     POON HC, 1984, PHYS REV B, V30, P6211, DOI 10.1103/PhysRevB.30.6211     SALDIN DK, 1990, PHYS REV LETT, V64, P1270, DOI 10.1103/PhysRevLett.64.1270     TONG SY, 1985, PHYS REV B, V32, P2096, DOI 10.1103/PhysRevB.32.2096     WANG XD, 1990, SCIENCE, V248, P1129, DOI 10.1126/science.248.4959.1129-b     WEI CM, IN PRESS PHYS REV B     WEI CM, 1990, PHYS REV LETT, V65, P2278, DOI 10.1103/PhysRevLett.65.2278     XU ML, 1989, SURF SCI, V207, P215, DOI 10.1016/0039-6028(89)90121-0TONG, SY WEI, CM ZHAO, TC HUANG, H LI, HAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Jan},
	pages = {60-63},
	type = {Article},
	abstract = {<p>We invert high-energy (E greater-than-or-equal-to 400 eV) photoelectron and Auger-electron interference patterns to construct 3D images of surface and interface atoms. A new scheme is introduced to correct the phase shift of the image. Image reconstruction is demonstrated for Si(111) square-root 3 x square-root 3-B, a system in which multiple-scattering effects are small and all source waves are equivalent. Using diffraction results from multiple-scattering slab calculations, we achieve a spatial resolution of 1.0-1.3 angstrom, thus qualifying the technique as a direct structural tool.</p>
},
	keywords = {ELECTRON DIFFRACTION, ENERGY, MULTIPLE, SI(111), SURFACE},
	isbn = {0031-9007},
	url = {<Go to ISI>://WOS:A1991ER07400016},
	author = {Tong, S. Y. and Wei, C. M. and Zhao, T. C. and Huang, H. and Li, H.}
}
