@article {486,
	title = {DIRECT ATOMIC-STRUCTURE BY HOLOGRAPHIC DIFFUSE LEED},
	journal = {Surface Science},
	volume = {274},
	number = {3},
	year = {1992},
	note = {<p>ISI Document Delivery No.: JH828Times Cited: 45Cited Reference Count: 24Cited References: BARTON JJ, 1988, PHYS REV LETT, V61, P1356, DOI 10.1103/PhysRevLett.61.1356 BARTON JJ, 1991, PHYS REV LETT, V67, P3106, DOI 10.1103/PhysRevLett.67.3106 BARTON JJ, 1991, STRUCTURE SURFACES, V3 BAUER E, 1990, CHEM PHYSICS SOLID S, V8 CHAMBERS SA, IN PRESS J VAC TECHN CHAMBERS SA, IN PRESS SURF SCI RE Duke C.B., 1974, Critical Reviews in Solid State Sciences, V4 HEINZ K, 1988, PROG SURF SCI, V27, P239, DOI 10.1016/0079-6816(88)90008-1 HEINZ K, 1985, PHYS REV LETT, V55, P2313 HU PJ, 1991, CHEM PHYS LETT, V183, P521, DOI 10.1016/0009-2614(91)80169-X HUANG H, 1991, PHYS REV B, V44, P3240, DOI 10.1103/PhysRevB.44.3240 IBACH H, 1986, SURF SCI, V176, P629, DOI 10.1016/0039-6028(86)90061-0 LI H, UNPUB SURF SCI PENDRY JB, 1984, SURF SCI, V145, P33, DOI 10.1016/0039-6028(84)90764-7 SALDIN DK, 1990, PHYS REV LETT, V64, P1270, DOI 10.1103/PhysRevLett.64.1270 STUCK A, 1992, SURF SCI, V264, P380, DOI 10.1016/0039-6028(92)90193-A SZOKE A, 1986, AIP C P, V147 TONG SY, 1991, PHYS REV LETT, V66, P60, DOI 10.1103/PhysRevLett.66.60 TONG SY, 1992, PHYS REV 0615 TONG SY, 1991, MATER RES SOC SYMP P, V208, P13 TONG SY, 1991, PHYS REV LETT, V67, P3102, DOI 10.1103/PhysRevLett.67.3102 VANHOVE MA, 1970, SURFACE CRYSTALLOGRA VANHOVE MA, 1975, J VAC SCI TECHNOL, V12, P231 WEI CM, 1990, PHYS REV LETT, V65, P2278, DOI 10.1103/PhysRevLett.65.2278WEI, CM TONG, SYELSEVIER SCIENCE BVAMSTERDAM</p>
},
	month = {Aug},
	pages = {L577-L582},
	type = {Article},
	abstract = {<p>A multiple-energy phase-summing method is applied to diffuse low-energy electron diffraction intensity spectra to obtain three-dimensional images of surface atoms. In this demonstration, calculated DLEED intensity spectra from a multiple scattering method are directly inverted to produce high-fidelity 3D images of near-neighbor atoms measured from an adatom. No prior knowledge of adsorption site, bond length, bond angle, or type of atom is needed. The images are essentially free from artifacts and have a spatial resolution of approximately 1 angstrom when viewed along any cut-plane. These results demonstrate that holographic DLEED has the potential of being an accurate and direct structural tool for low-density disordered adsorption systems.</p>
},
	keywords = {MULTIPLE-SCATTERING, PHOTOEMISSION, SURFACES},
	isbn = {0039-6028},
	url = {<Go to ISI>://WOS:A1992JH82800002},
	author = {Wei, C. M. and Tong, S. Y.}
}
