@article {487,
	title = {SURFACE AND BULK PHOTOELECTRON DIFFRACTION FROM W(110) 4F CORE LEVELS},
	journal = {Physical Review B},
	volume = {48},
	number = {7},
	year = {1993},
	note = {<p>ISI Document Delivery No.: LW026Times Cited: 28Cited Reference Count: 20Cited References: BARTYNSKI RA, 1989, PHYS REV B, V40, P5340, DOI 10.1103/PhysRevB.40.5340 BREAUX LH, 1986, NUCL INSTRUM METH A, V246, P248, DOI 10.1016/0168-9002(86)90083-5 CHAUVEAU D, 1984, SOLID STATE COMMUN, V52, P635, DOI 10.1016/0038-1098(84)90723-3 CHIANG TC, 1988, CRIT REV SOLID STATE, V14, P269, DOI 10.1080/10408438808243735 DEBE MK, 1979, SURF SCI, V81, P193, DOI 10.1016/0039-6028(79)90513-2 DRAKAKI M, UNPUB EGELHOFF WF, 1990, CRIT REV SOLID STATE, V16, P213, DOI 10.1080/10408439008244629 JUGNET Y, 1988, PHYS REV B, V37, P8066, DOI 10.1103/PhysRevB.37.8066 KEVAN SD, 1981, PHYS REV LETT, V46, P1629, DOI 10.1103/PhysRevLett.46.1629 FEDER R, 1981, SURF SCI, V103, P75, DOI 10.1016/0039-6028(81)90100-X LI CH, 1978, PHYS REV B, V17, P3128, DOI 10.1103/PhysRevB.17.3128 MATHEISS LF, 1965, PHYS REV, V139, P236 PURCELL KG, 1989, SURF SCI, V208, P245, DOI 10.1016/0039-6028(89)90002-2 RIFFE DM, UNPUB RIFFE DM, 1989, PHYS REV LETT, V63, P1976, DOI 10.1103/PhysRevLett.63.1976 Spanjaard D., 1985, Surface Science Reports, V5, DOI 10.1016/0167-5729(85)90003-2 STEVENS HA, 1983, J ELECTRON SPECTROSC, V32, P327, DOI 10.1016/0368-2048(83)80027-9 Van Hove M.A., 1979, SURFACE CRYSTALLOGRA WEISS KU, 1992, PHYS REV LETT, V69, P3196, DOI 10.1103/PhysRevLett.69.3196 WOODRUFF DP, 1978, PHYS REV LETT, V41, P1130, DOI 10.1103/PhysRevLett.41.1130KIM, B CHEN, J ERSKINE, JL MEI, WN WEI, CMAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Aug},
	pages = {4735-4740},
	type = {Article},
	abstract = {<p>Energy- and angle-dependent photoelectron cross sections from surface and bulk W(110) 4f7/2 core levels are measured and compared with dynamical multiple scattering calculations. The agreement between experimental and theoretical results is found to be significantly better than corresponding previous studies, permitting a determination of the first layer atomic plane distance: d12 = 2.26 +/- 0.05 angstrom. Forward-scattering enhancements along bond directions are observed under selected scattering conditions. In all cases, final-state multiple scattering accounts for the principal energy and angle dependencies in the cross section. Typical variation of bulk and surface 4f photoelectron intensities with kinetic energy or emission angle resulting from final-state effects is observed to be a factor of 2. This result suggests that previous core-level spectra for stepped W(110) surfaces have been incorrectly interpreted.</p>
},
	keywords = {CRYSTALLOGRAPHY, ELECTRON, PHOTOEMISSION, SCATTERING, SPECTROSCOPY},
	isbn = {0163-1829},
	url = {<Go to ISI>://WOS:A1993LW02600066},
	author = {Kim, B. and Chen, J. and Erskine, J. L. and Mei, W. N. and Wei, C. M.}
}
