@article {495,
	title = {Surface-dimer and bulk-atom imaging of the Si(001) (2x1) surface by Kikuchi electron holography},
	journal = {Physical Review B},
	volume = {52},
	number = {23},
	year = {1995},
	note = {<p>ISI Document Delivery No.: TN309Times Cited: 7Cited Reference Count: 25Cited References: ABRAHAM FF, 1985, SURF SCI, V163, pL752, DOI 10.1016/0039-6028(85)91055-6 ASCOLANI H, 1992, PHYS REV B, V46, P4899, DOI 10.1103/PhysRevB.46.4899 BAHR CC, 1987, PHYS REV B, V35, P3773, DOI 10.1103/PhysRevB.35.3773 BARTON JJ, 1988, PHYS REV LETT, V61, P1356, DOI 10.1103/PhysRevLett.61.1356 HONG IH, 1994, SURF SCI, V312, pL743, DOI 10.1016/0039-6028(94)90794-3 HOUDRE R, 1990, CRIT REV SOLID STATE, V162, P91 HU PJ, 1991, NATURE, V353, P831, DOI 10.1038/353831a0 HUSSAIN Z, 1981, P NATL ACAD SCI USA, V78, P5293, DOI 10.1073/pnas.78.9.5293 JENG PR, 1995, PHYS REV B, V51, P13645, DOI 10.1103/PhysRevB.51.13645 JONA F, 1977, J PHYS C SOLID STATE, V10, pL67, DOI 10.1088/0022-3719/10/4/003 POON HC, 1986, PHYS REV B, V33, P2198, DOI 10.1103/PhysRevB.33.2198 POPPENDIECK TD, 1978, SURF SCI, V75, P287, DOI 10.1016/0039-6028(78)90253-4 SALDIN DK, 1993, PHYS REV B, V48, P8234, DOI 10.1103/PhysRevB.48.8234 SZOKE A, 1986, AIP C P, V147 TERMINELLO LJ, 1993, PHYS REV LETT, V70, P599, DOI 10.1103/PhysRevLett.70.599 TONG SY, 1992, PHYS REV B, V46, P2452, DOI 10.1103/PhysRevB.46.2452 TONG SY, 1991, PHYS REV LETT, V67, P3102, DOI 10.1103/PhysRevLett.67.3102 TROMP RM, 1983, SURF SCI, V133, P137, DOI 10.1016/0039-6028(83)90488-0 WEI CM, 1992, SURF SCI, V274, pL577, DOI 10.1016/0039-6028(92)90828-T WEI CM, 1994, SURF REV LETT, V1, P335, DOI 10.1142/S0218625X94000333 WEI CM, 1994, PHYS REV B, V49, P5109, DOI 10.1103/PhysRevB.49.5109 WEI CM, 1994, CHEM PHYS LETT, V228, P513, DOI 10.1016/0009-2614(94)00980-5 WEI CM, 1994, PHYS REV LETT, V72, P2434, DOI 10.1103/PhysRevLett.72.2434 WU H, 1993, PHYS REV LETT, V71, P251, DOI 10.1103/PhysRevLett.71.251 ZHAO RG, 1991, STRUCTURE SURFACES, V3, P517Hong, IH Shyu, SC Chou, YC Wei, CMAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Dec},
	pages = {16884-16891},
	type = {Article},
	abstract = {<p>Direct inversion of measured multiple-energy Kikuchi electron patterns from a Si(001) (2 x 1) surface with glancing and normal-incidence geometry shows clear images of the surface dimer and the bulk atoms. The three-dimensional artifact-free real-space images of the atoms contributed from different local emitters are resolved clearly. The observations demonstrate that Kikuchi electron holography has the surface sensitivity and can reveal the atomic structures of complicated multiemitter systems. By changing the collecting angle of Kikuchi electrons, one can selectively image the atoms behind the emitter in the backward direction; thus the surface and the bulk information can be obtained with different collecting angles. Therefore, the potential of Kikuchi electron holography to solve the local atomic structure of the unknown surfaces is high.</p>
},
	keywords = {IMAGES, PATTERNS, PHOTOELECTRON DIFFRACTION},
	isbn = {0163-1829},
	url = {<Go to ISI>://WOS:A1995TN30900083},
	author = {Hong, I. H. and Shyu, S. C. and Chou, Y. C. and Wei, C. M.}
}
