@article {513,
	title = {Direct method of surface structure determination by Patterson analysis of correlated thermal diffuse scattering for Si(001)2X1},
	journal = {Physical Review B},
	volume = {62},
	number = {23},
	year = {2000},
	note = {<p>ISI Document Delivery No.: 385GKTimes Cited: 5Cited Reference Count: 22Cited References: Abukawa T, 1998, J ELECTRON SPECTROSC, V88, P533, DOI 10.1016/S0368-2048(97)00270-3 Abukawa T, 1999, PHYS REV LETT, V82, P335, DOI 10.1103/PhysRevLett.82.335 Azaroff L.V., 1968, ELEMENTS XRAY CRYSTA BARTON JJ, 1988, PHYS REV LETT, V61, P1356, DOI 10.1103/PhysRevLett.61.1356 CHADI DJ, 1979, PHYS REV LETT, V43, P43, DOI 10.1103/PhysRevLett.43.43 Felici R, 1997, SURF SCI, V375, P55, DOI 10.1016/S0039-6028(97)80005-2 Gunnella R, 1998, PHYS REV B, V57, P14739, DOI 10.1103/PhysRevB.57.14739 HARP GR, 1990, PHYS REV LETT, V65, P1012, DOI 10.1103/PhysRevLett.65.1012 HEINZ K, 1994, SURF REV LETT, V1, P319, DOI 10.1142/S0218625X94000321 Marks LD, 1998, SURF REV LETT, V5, P1087, DOI 10.1142/S0218625X98001444 RAMSTAD A, 1995, PHYS REV B, V51, P14504, DOI 10.1103/PhysRevB.51.14504 SAKAMOTO T, 1986, JPN J APPL PHYS 2, V25, pL78, DOI 10.1143/JJAP.25.L78 SALDIN DK, 1990, PHYS REV LETT, V64, P1270, DOI 10.1103/PhysRevLett.64.1270 SEVILLANO E, 1979, PHYS REV B, V20, P4908, DOI 10.1103/PhysRevB.20.4908 TONG SY, 1992, PHYS REV B, V46, P2452, DOI 10.1103/PhysRevB.46.2452 TROMP RM, 1983, SURF SCI, V133, P137, DOI 10.1016/0039-6028(83)90488-0 Waller I, 1923, Z PHYS, V17, P398, DOI 10.1007/BF01328696 WANG ZL, 1991, ULTRAMICROSCOPY, V38, P181, DOI 10.1016/0304-3991(91)90119-Q WANG ZL, 1992, PHILOS MAG B, V65, P559, DOI 10.1080/13642819208207650 Wang Z.L., 1995, ELASTIC INELASTIC SC WEI CM, 1994, SURF REV LETT, V1, P335, DOI 10.1142/S0218625X94000333 WEI CM, 1994, PHYS REV LETT, V72, P2434, DOI 10.1103/PhysRevLett.72.2434Abukawa, T Wei, CM Yoshimura, K Kono, SAMERICAN PHYSICAL SOCCOLLEGE PK</p>
},
	month = {Dec},
	pages = {16069-16073},
	type = {Article},
	abstract = {<p>A simple oscillatory intensity variation in medium-energy electron diffraction found recently [Abukawa ei al., Phys. Rev. Lett. 82, 335 (1999)] was termed correlated thermal diffuse scattering (CTDS). The potential of CTDS as a direct surface structural tool has been fully explored for the Si(001)2 X 1 surface at 300 K in a very-grazing-incidence condition. Nearly 2 pi solid-angle, three-dimensional (3D) CTDS patterns were measured for an energy range of 500-2000 eV. The 3D Patterson functions obtained by Fourier inversion of the measured CTDS patterns clearly revealed the building blocks of the Si(001)2 X 1 surface, i.e., the bond orientations and lengths of the buckled Si dimers, within an accuracy of 1 degrees and 0.1 Angstrom, respectively.</p>
},
	keywords = {ENERGY-ELECTRON-DIFFRACTION, HOLOGRAPHY, PHOTOELECTRON DIFFRACTION, RECONSTRUCTION},
	isbn = {0163-1829},
	url = {<Go to ISI>://WOS:000165995100113},
	author = {Abukawa, T. and Wei, C. M. and Yoshimura, K. and Kono, S.}
}
