Ab-Initio Simulation Laboratory

Citation:

Wei, C. M., Tong S. Y., Wedler H., Mendez M. A., & Heinz K. (1994).  DIRECT STRUCTURAL DETERMINATION BY INVERSION OF EXPERIMENTAL DIFFUSE LOW-ENERGY-ELECTRON DIFFRACTION INTENSITIES. Physical Review Letters. 72, 2434-2437., Apr, Number 15

Abstract:

We demonstrate that two-dimensionally resolved diffuse low-energy electron diffraction intensities can be measured with sufficient accuracy and at multiple energies to allow direct inversion for a low coverage (5%) disordered K/Ni(100) surface. The data inversion reveals three-dimensional coordinates of atoms with atom images whose full width at half maximum is less than 1 angstrom in all spatial directions. By varying the angle of incidence, first layer and second layer near-neighbor Ni atoms are separately imaged. This is the first demonstration of multiple-energy internal-source electron holography using measured elastically backscattered electrons.

Notes:

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